{"title":"Characterization and Considerations for Upset in FPGA","authors":"Christian Johansson, T. Manefjord","doi":"10.1109/NORCHIP.2018.8573506","DOIUrl":null,"url":null,"abstract":"The increase in performance and the relatively low cost have made the FPGA an attractive technology for use in various product areas. When used in safety-critical applications, the susceptibility against upsets due to cosmic radiation requires special considerations. In this paper, a number of mitigation techniques against upsets are discussed together with the use of a COTS IP. Furthermore, practical tests are performed to validate the upset rates and mitigation techniques. The tests are performed on a Xilinx UltraScale+MPSOC FPGA.","PeriodicalId":152077,"journal":{"name":"2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NORCHIP.2018.8573506","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The increase in performance and the relatively low cost have made the FPGA an attractive technology for use in various product areas. When used in safety-critical applications, the susceptibility against upsets due to cosmic radiation requires special considerations. In this paper, a number of mitigation techniques against upsets are discussed together with the use of a COTS IP. Furthermore, practical tests are performed to validate the upset rates and mitigation techniques. The tests are performed on a Xilinx UltraScale+MPSOC FPGA.