Deformation Measurements used for Design Optimization and Verification during Industrial Electronic Board (Product) Manufacturing

B. Schwarz
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引用次数: 3

Abstract

Thermo mechanical stresses in electronics can be calculated by FEM but sometimes it is faster and more comfortable to Measure the deformations of your Boards and electronic Components to see their behavior if temperature is changing. During the electronic product lifetime the soldering process is the highest thermo mechanical stress. Especially for the lead free reflow peak of more than 240degC some material combinations show a large deformation. But also later in the field at customer side the time to failure is depending from the stress & strain to the product. The differences day/night and operating/standby cause a thermo mechanic cycling and products fail if materials are getting tired and function fails. Beside other processes like diffusion and migration tins thermo mechanical stress can lead to early life time end. So it is important that the thermo-mechanical deformations are minimized and risks are noticed right in time - if possible during prototype stadium - where normally a high pressure of time and a quick measurement technique is welcome. The trend to higher application temperatures (e.g. Automotive sector: engine control) also is a main reason to care about tins land of optimizations. Due to the fact that the electronic board manufacturing in the assembly lines are consisting of many single processes but the components from the different suppliers are not known in regard to their material details and compositions, it's often not possible to start a simulation, which delivers true results, but it's much easier and faster to do a deformation measurement as a function of temperature. Three different measurement techniques (methods) are introduced: Shadow Moire or Interference Technique; Pattern Correlation Technique: Line Projection Technique. Finally some results are shown and examples from Siemens Product optimizations are given (comparison of different board materials/manufacturers, effect of preconditioning (tempering) to the warpage behavior of PBGA. examples of failures & failure modes if stress/strain is too high). Of course the measurement results are used to confirm the FEM results (No FEM without verification) and support DOE. But our experience is, that this methods of the quick measurement of deformations is used mainly as a tool to perform a kind of incoming inspection of delivered supplements like packages and boards. Often a poor thermo mechanical behavior could be proved and any changes of package properties of different date code lots could be recognized. If those male functions are detected before products reach our customers a lot of money (rework) could be saved and products of high thermo mechanical stability with few internal stresses could be delivered to market. The ratio of winning knowledge to examination costs is very high and the deformation measurements are used in all sectors of electronic product manufacturing.
工业电子电路板(产品)制造过程中用于设计优化和验证的变形测量
电子产品中的热机械应力可以通过FEM计算,但有时测量电路板和电子元件的变形以查看温度变化时它们的行为会更快更舒适。在电子产品的生命周期中,焊接过程是最大的热机械应力。特别是对于大于240℃的无铅回流峰,一些材料组合出现较大的变形。但后来在客户端,失败的时间取决于产品的压力和应变。昼夜和运行/待机的差异会导致热机械循环,如果材料疲劳和功能失效,产品就会失效。除了扩散和迁移等其他过程外,热机械应力也会导致早期生命结束。因此,重要的是要尽量减少热机械变形,并及时发现风险——如果可能的话,在原型体育场期间——通常情况下,高时间压力和快速测量技术是受欢迎的。更高应用温度的趋势(例如汽车行业:发动机控制)也是关注tin优化领域的主要原因。由于装配线上的电路板制造由许多单一工艺组成,但来自不同供应商的组件在材料细节和成分方面并不为人所知,因此通常不可能开始模拟,从而提供真实的结果,但是做变形测量作为温度的函数要容易得多,也要快得多。介绍了三种不同的测量技术(方法):阴影云纹或干涉技术;模式相关技术:线投影技术。最后给出了一些结果,并给出了西门子产品优化的例子(不同板材料/制造商的比较,预处理(回火)对PBGA翘曲行为的影响)。如果应力/应变过高,失效和失效模式的例子)。当然,测量结果是用来验证有限元结果(没有验证的没有有限元)和支持DOE。但我们的经验是,这种快速测量变形的方法主要是作为一种工具来执行一种进料检查交付的补充,如包装和板。通常可以证明一个不良的热力学行为,并可以识别不同日期代码批次的包装性能的任何变化。如果在产品到达我们的客户之前检测到这些功能,可以节省大量的资金(返工),并且可以将具有高热机械稳定性且内应力小的产品交付给市场。获得知识与检验成本的比例非常高,变形测量在电子产品制造的各个部门都有应用。
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