Diagnostics of large-area solar cell homogeneity using LBIV method

Abstract

The paper refers about a possibility to check recombination rate distribution over the area of power (large-area) solar cells from measured values of open circuit voltage V/sub OC/ using local irradiation by monochromatic light a suitable wavelengths (LBIV - Light Beam Initiated Voltage). The method can give information both about recombination centres distribution in large-area solar cells and surface recombination rate at the antireflection coating. From V/sub OC/ distribution, also position and extent of local defects can also be determined. The method can be used to investigate the influence of technology on characteristics of solar cells as an in-process checking with the aim of increasing efficiency and reliability of solar cells.