{"title":"Interrelation of metrology, testing and quality in semiconductor production","authors":"R. Z. Aymagambetova","doi":"10.1109/SIBCON.2017.7998477","DOIUrl":null,"url":null,"abstract":"The effect of metrology on products testing, conformity assessment and quality systems is analyzed. The main fields of metrological activities having effect on the quality of products testing and used at testing laboratories are given.","PeriodicalId":190182,"journal":{"name":"2017 International Siberian Conference on Control and Communications (SIBCON)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 International Siberian Conference on Control and Communications (SIBCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIBCON.2017.7998477","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The effect of metrology on products testing, conformity assessment and quality systems is analyzed. The main fields of metrological activities having effect on the quality of products testing and used at testing laboratories are given.