Multiple fault detection and location in WSI baseline interconnection networks

C. Feng, W. Huang, F. Lombardi
{"title":"Multiple fault detection and location in WSI baseline interconnection networks","authors":"C. Feng, W. Huang, F. Lombardi","doi":"10.1109/ICWSI.1990.63895","DOIUrl":null,"url":null,"abstract":"Presents an approach for the full diagnosis (detection and location) of baseline interconnection networks implemented in WSI. A multiple fault model as applicable to production of these devices, is assumed. This implies that a totally exhaustive combinatorial fault model is used in the analysis. It is proved that the maximum number of tests for detecting multiple faults (i.e. 2(1+log/sub 2/N), where N is the number of inputs/outputs), can be used to locate and identify multiple faulty switching elements provided that no intermittent and/or transient behaviour is present, i.e. using the definition of no logically undefined and no undetermined outputs are present. The proposed diagnostic technique is based on a process which reveals the switching state of each element on a stage by stage basis using the test set. No additional hardware is therefore required. The proposed technique can be efficiently used in the manufacturing of complex interconnection networks using advanced integration techniques such as WSI.<<ETX>>","PeriodicalId":206140,"journal":{"name":"1990 Proceedings. International Conference on Wafer Scale Integration","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1990 Proceedings. International Conference on Wafer Scale Integration","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICWSI.1990.63895","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Presents an approach for the full diagnosis (detection and location) of baseline interconnection networks implemented in WSI. A multiple fault model as applicable to production of these devices, is assumed. This implies that a totally exhaustive combinatorial fault model is used in the analysis. It is proved that the maximum number of tests for detecting multiple faults (i.e. 2(1+log/sub 2/N), where N is the number of inputs/outputs), can be used to locate and identify multiple faulty switching elements provided that no intermittent and/or transient behaviour is present, i.e. using the definition of no logically undefined and no undetermined outputs are present. The proposed diagnostic technique is based on a process which reveals the switching state of each element on a stage by stage basis using the test set. No additional hardware is therefore required. The proposed technique can be efficiently used in the manufacturing of complex interconnection networks using advanced integration techniques such as WSI.<>
WSI基线互连网络中的多故障检测与定位
提出了一种在WSI中实现的基线互连网络的全面诊断(检测和定位)方法。假设多故障模型适用于这些设备的生产。这意味着在分析中采用了全穷举组合故障模型。证明了用于检测多个故障的最大测试次数(即2(1+log/sub 2/N),其中N是输入/输出的数量)可用于定位和识别多个故障开关元件,前提是不存在间歇和/或瞬态行为,即使用不存在逻辑未定义和不存在未确定输出的定义。所提出的诊断技术是基于一个过程,该过程利用测试集逐级显示每个元件的开关状态。因此不需要额外的硬件。该技术可以有效地应用于复杂互连网络的制造,并采用先进的集成技术,如WSI.>
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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