Environmental Impact Evaluation Methodology for Emerging Silicon-Based Technologies

A. Somani, P. Gschwend, S. J. White, D. Boning, R. Reif
{"title":"Environmental Impact Evaluation Methodology for Emerging Silicon-Based Technologies","authors":"A. Somani, P. Gschwend, S. J. White, D. Boning, R. Reif","doi":"10.1109/ISEE.2006.1650072","DOIUrl":null,"url":null,"abstract":"Semiconductor technology evolves rapidly to enable continued improvements in performance and capability, and reductions in cost. We emphasize the need also for rapid EHS assessment of new technology alternatives. This effort provides a rapid methodology for evaluating new process options in the research phase, particularly to identify unit processes which may be of environmental concern compared to existing technologies. The use of novel materials should be estimated, in the context of both the fabrication facility and the local and global natural cycles. Unit processes of concern should be jointly optimized on the three axes of cost, performance, and environment. A case study examining 3D integration of ICs, with a focus on the handle wafer unit process steps, illustrates the proposed methodology","PeriodicalId":141255,"journal":{"name":"Proceedings of the 2006 IEEE International Symposium on Electronics and the Environment, 2006.","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2006 IEEE International Symposium on Electronics and the Environment, 2006.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEE.2006.1650072","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Semiconductor technology evolves rapidly to enable continued improvements in performance and capability, and reductions in cost. We emphasize the need also for rapid EHS assessment of new technology alternatives. This effort provides a rapid methodology for evaluating new process options in the research phase, particularly to identify unit processes which may be of environmental concern compared to existing technologies. The use of novel materials should be estimated, in the context of both the fabrication facility and the local and global natural cycles. Unit processes of concern should be jointly optimized on the three axes of cost, performance, and environment. A case study examining 3D integration of ICs, with a focus on the handle wafer unit process steps, illustrates the proposed methodology
新兴硅基技术的环境影响评价方法
半导体技术发展迅速,使性能和能力不断提高,并降低成本。我们还强调需要对新技术替代方案进行快速的EHS评估。这项工作提供了一种快速的方法来评估研究阶段的新工艺选择,特别是确定与现有技术相比可能对环境有影响的单元工艺。新材料的使用应该在制造设施和当地和全球自然循环的背景下进行评估。所关注的单元过程应在成本、性能和环境三个轴上共同优化。一个研究集成电路3D集成的案例研究,重点是处理晶圆单元的工艺步骤,说明了所提出的方法
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信