{"title":"The trench MOS barrier Schottky (TMBS) rectifier","authors":"M. Mehrotra, B. J. Baliga","doi":"10.1109/IEDM.1993.347222","DOIUrl":null,"url":null,"abstract":"A new rectifier structure, called Trench MOS Barrier Schottky (TMBS) rectifier has been modeled and fabricated with excellent trade-off characteristics. Two-dimensional numerical simulations have demonstrated coupling between the charge in the N/sup -/ drift region and the metal on the trench sidewalls resulting in an improved electric field distribution. For epitaxial layer doping of 1/spl times/10/sup 17/ cm/sup -3/, simulations show that breakdown voltages of three times the plane parallel breakdown can be achieved with low leakage current. The measured forward drops for the 0.5 /spl mu/m devices at 60 A/cm/sup 2/ and 300 A/cm/sup 2/ were 0.2 V and 0.28 V respectively. Due to smaller drift region resistances, TMBS rectifiers can be operated at large current densities (/spl ap/300 A/cm/sup 2/) resulting in small device sizes.<<ETX>>","PeriodicalId":346650,"journal":{"name":"Proceedings of IEEE International Electron Devices Meeting","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"34","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1993.347222","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 34
Abstract
A new rectifier structure, called Trench MOS Barrier Schottky (TMBS) rectifier has been modeled and fabricated with excellent trade-off characteristics. Two-dimensional numerical simulations have demonstrated coupling between the charge in the N/sup -/ drift region and the metal on the trench sidewalls resulting in an improved electric field distribution. For epitaxial layer doping of 1/spl times/10/sup 17/ cm/sup -3/, simulations show that breakdown voltages of three times the plane parallel breakdown can be achieved with low leakage current. The measured forward drops for the 0.5 /spl mu/m devices at 60 A/cm/sup 2/ and 300 A/cm/sup 2/ were 0.2 V and 0.28 V respectively. Due to smaller drift region resistances, TMBS rectifiers can be operated at large current densities (/spl ap/300 A/cm/sup 2/) resulting in small device sizes.<>