{"title":"Short Flow Characterization Vehicle (Test Chip) Usage in Advanced Technology Development and Yield Improvement","authors":"T. Brożek","doi":"10.1109/EDTM.2018.8421446","DOIUrl":null,"url":null,"abstract":"Short flow Characterization Vehicles® can be used at early development phase and offer short learning cycles. Their main usage is to support patterning scheme, validate and freeze design rules, identify and solve major integration and process issues. They have been proven to work for BEOL, FEOL, MOL, and for BEOL-integrated embedded memory elements.","PeriodicalId":418495,"journal":{"name":"2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTM.2018.8421446","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Short flow Characterization Vehicles® can be used at early development phase and offer short learning cycles. Their main usage is to support patterning scheme, validate and freeze design rules, identify and solve major integration and process issues. They have been proven to work for BEOL, FEOL, MOL, and for BEOL-integrated embedded memory elements.