Automatic insertion of selective TMR for SEU mitigation

2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI:10.1109/RADECS.2008.5782728

Ó. Ruano, P. Reviriego, J. A. Maestro

引用次数: 8

Abstract

In this paper, a methodology is presented to perform automatic selective TMR insertion on digital circuits, having as a constraint the required reliability level. Such reliability is guaranteed while reducing the area compared with TMR.

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自动插入选择性TMR以缓解SEU

在本文中，提出了一种方法来执行自动选择性TMR插入在数字电路中，具有作为约束所需的可靠性水平。与TMR相比，这种可靠性得到了保证，同时减少了面积。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2008 European Conference on Radiation and Its Effects on Components and Systems

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