RF IC Susceptibility of VHF transceiver excited from Power terminal with PCI

Abstract

In order to determine the failure mechanism of VHF transceiver in electromagnetic environment effects (E3), the pulse current injection (PCI) test is conducted at the power terminal. The test results indicate that the IC server circuit failure of the low noise amplifier (LNA) module is the most underlying cause of the system fault. This illustration displays the specific requirements for IC sensitivity study in E3 compared with the traditional subjects, such as modeling, emission and susceptibility just aiming at IC itself. And the further work need to be done are discussed and suggested finally.