{"title":"Method and Device for Measuring Capacitance Type Electric Trancducers Parameters","authors":"N. Pshchelko, E. Vodkailo, O. Tsareva","doi":"10.1109/EExPolytech.2019.8906822","DOIUrl":null,"url":null,"abstract":"A non-destructive method for controlling the parameters of capsules of electrostatic transducers of a capacitor type with moving plates was developed. The method is based on the measurement of the capacitance-voltage characteristic of the capsule. Based on the results of this measurement, a whole complex of the most important parameters of the capsule is determined - the thickness of the air gap, the membrane tension, the surface potential of the electret, etc. As an example, the practical use of the method for determining the quality of electret microphones is demonstrated.","PeriodicalId":305685,"journal":{"name":"2019 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)","volume":"174 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EExPolytech.2019.8906822","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A non-destructive method for controlling the parameters of capsules of electrostatic transducers of a capacitor type with moving plates was developed. The method is based on the measurement of the capacitance-voltage characteristic of the capsule. Based on the results of this measurement, a whole complex of the most important parameters of the capsule is determined - the thickness of the air gap, the membrane tension, the surface potential of the electret, etc. As an example, the practical use of the method for determining the quality of electret microphones is demonstrated.