A testing scheme for crosstalk faults based on the oscillation test signal [VLSI]

Abstract

A test scheme for crosstalk faults, based on an oscillation signal, is proposed. It uses an oscillation signal applied to an affecting line and detects induced pulses on a victim line if a crosstalk fault exists between these two lines. It is simple and eliminates the complicated timing issues during test generation for crosstalk faults in conventional approaches. The test generation and fault simulation based on the scheme are described. Experimental results are also presented to show the described test generation procedure is effective in generating test patterns for this scheme.