Zou Deshu, Xu Chen, C. Jianxin, Shi Chen, Du Jinyu, Deng Jun, Zhang Li, Shen Guangdi
{"title":"SiGe/Si HBTs with current gain of negative temperature dependence","authors":"Zou Deshu, Xu Chen, C. Jianxin, Shi Chen, Du Jinyu, Deng Jun, Zhang Li, Shen Guangdi","doi":"10.1109/ICSICT.2001.981552","DOIUrl":null,"url":null,"abstract":"In this paper, we analysis the basic principle of SiGe/Si HBTs, design and fabricate power transistors with current gain of negative temperature dependence. The current gain of such transistors decreases from 33 to 20, when the temperature rises from 300 K to 385 K, at the case the quiescent current, I/sub cm/, is 200 mA and V/sub ce/ is 2 V. These power HBTs are to be used in medium power amplifiers.","PeriodicalId":349087,"journal":{"name":"2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSICT.2001.981552","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
In this paper, we analysis the basic principle of SiGe/Si HBTs, design and fabricate power transistors with current gain of negative temperature dependence. The current gain of such transistors decreases from 33 to 20, when the temperature rises from 300 K to 385 K, at the case the quiescent current, I/sub cm/, is 200 mA and V/sub ce/ is 2 V. These power HBTs are to be used in medium power amplifiers.