Discussion Group Summary Wafer Level Reliability (WLR)

Abstract

ATTENDANCE could be used to effectively measure reliability of a fa.b’s products. Representatives of the FSA were present to respond to questions and to clarify objectives of the project. After the discussion, the consensus of the groups was that The WLR discussion group was well-attended, averaging approximately 25 persons per night. As expected, some lively discussion ensued from these groups, which represented many different facets of the semiconductor industry.