Humidity Activated Surface Leakage Paths on T.O. Case Style Glass Headers

Abstract

This paper reviews the analysis of exterior leakage paths causing failures of common 2N2222A transistors. The failure mechanism, exterior leakage paths activated in high humidity conditions on the surface of glass seals, is identified. The glass constituents which are responsible for this intermittent, sometime self-correcting failure mechanism are discussed and the method of conduction analyzed.