A new approach to the self-consistent solution of the Schrodinger-Poisson equations in nanowire MOSFETs

E. Gnani, S. Reggiani, M. Rudan, G. Baccarani
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引用次数: 26

Abstract

In this work, we investigate the electrostatics of fully-depleted cylindrical nanowire (CNW) MOSFETs accounting for quantum effects and, in doing so, we propose a new approach for the self-consistent solution of the Schrodinger-Poisson equations based on a rigorous time-independent perturbation approach. The strength of this method is that the Schrodinger equation is solved in a semi-analytical form, thus eliminating discretization errors and providing very accurate energy eigenvalues and eigenfunctions: furthermore, the computation time is cut down by an order of magnitude. A major result of this investigation is that the ON/OFF current ratio increases as the diameter of the CNW-MOSFET is scaled down. This makes them good candidates for an advanced low-leakage CMOS technology. The above technique is finally used to investigate the influence of high-/spl kappa/ gate dielectrics on the electrostatics of CNW-MOSFETs, indicating that an improved performance is achieved, though not as large as one would expect from the /spl kappa/ ratio.
纳米线mosfet中薛定谔-泊松方程自洽解的新方法
在这项工作中,我们研究了考虑量子效应的完全耗尽圆柱形纳米线(CNW) mosfet的静电,并在此过程中,我们提出了一种基于严格的时间无关摄动方法的薛定谔-泊松方程自洽解的新方法。该方法的优点是采用半解析形式求解薛定谔方程,从而消除了离散化误差,提供了非常精确的能量特征值和特征函数,并且计算时间缩短了一个数量级。这项研究的一个主要结果是,随着CNW-MOSFET直径的缩小,开/关电流比增加。这使得它们成为先进的低漏CMOS技术的良好候选者。最后利用上述技术研究了高/spl kappa/栅极电介质对cnw - mosfet静电性能的影响,表明性能得到了改善,尽管没有人们期望的/spl kappa/比那么大。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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