{"title":"Lifetime and reliability analysis of klystrons","authors":"A. Balkcum, T. Habermann","doi":"10.1109/IVEC.2013.6570967","DOIUrl":null,"url":null,"abstract":"Repair histories for nearly 1,700 klystrons of four fundamentally different design types and applications have been monitored for up to 22 years. Statistical analysis of the failure data indicate mean time between failure values at the 90% confidence level ranging from 18 to 63 field service years for these devices.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"166 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2013.6570967","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Repair histories for nearly 1,700 klystrons of four fundamentally different design types and applications have been monitored for up to 22 years. Statistical analysis of the failure data indicate mean time between failure values at the 90% confidence level ranging from 18 to 63 field service years for these devices.