K. Tanaka, I. Kidoguchi, H. Adachi, T. Fukuhisa, M. Mannoh, A. Takamori
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引用次数: 2
Abstract
due to a facilities interruption of the lifetesting rack. These reliability results suggest their usefulness for DVD recording, printer, and other applications. In summary, we have achieved highperformance 650-nm single-mode lasers that show high single transverse mode powers up to 90 mW and high-temperature operation over 9 O O C . Over 900 hours of life testing shows almost no degradation at 30 mW and 50 "C. The work was supported by the NIST Advanced Technology Program.