{"title":"A two-phase fault simulation scheme for sequential circuits","authors":"Wen Ching Wu, Chung-Len Lee, Jwu-E Chen","doi":"10.1109/ATS.1993.398780","DOIUrl":null,"url":null,"abstract":"A two-phase fault simulation scheme for sequential circuits is proposed. The scheme is done by first performing the true value simulation with several initial patterns and then by performing the fault simulation with the rest of patterns. With the fault simulation approach, some faults which consume much simulation time can be easily and quickly identified and dropped early. As a result, significant speedup on simulation time is obtained. Five cases of faults which cause problems in fault simulation are also discussed.<<ETX>>","PeriodicalId":228291,"journal":{"name":"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1993.398780","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A two-phase fault simulation scheme for sequential circuits is proposed. The scheme is done by first performing the true value simulation with several initial patterns and then by performing the fault simulation with the rest of patterns. With the fault simulation approach, some faults which consume much simulation time can be easily and quickly identified and dropped early. As a result, significant speedup on simulation time is obtained. Five cases of faults which cause problems in fault simulation are also discussed.<>