High power diffraction-limited ultrashort pulse generation from double tapered semiconductor laser diodes

Ziping Jiang, I. White, F. Laughton, R. Penty, M. McCall, H. Tsang
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Abstract

One promising way of generating high power diffraction-limited output from a semiconductor laser diode is to fabricate a double tapered device by varying the stripe width along the cavity, in order to produce wide stripes at the facets and a narrow stripe at the center. The narrow stripe near the middle of the cavity acts as a spatial filter to maintain a good quality spatially coherent output, whilst the wide stripes at the facets have the dual benefits of increasing the active volume (thus increasing optical power generation) and increasing the threshold power before catastrophic facet damage occurs. High power single lateral mode operation has already been demonstrated by using various tapered devices[l, 2, 3] and much work has been carried out on tapered semiconductor laser amplifiers [5, 4]. However, the nature of double tapered device in obtaining high power and diffraction limited output is still poorly understood and optimization in design is badly needed.
双锥形半导体激光二极管产生高功率限制衍射的超短脉冲
从半导体激光二极管产生高功率衍射限制输出的一种有希望的方法是通过改变沿腔的条纹宽度来制造双锥形器件,以便在切面产生宽条纹和在中心产生窄条纹。靠近腔中央的窄条纹充当空间滤波器,以保持高质量的空间相干输出,而面处的宽条纹具有增加有源体积(从而增加光功率)和在灾难性面损伤发生之前增加阈值功率的双重好处。高功率单侧模操作已经通过使用各种锥形器件得到了证明[1,2,3],并且在锥形半导体激光放大器上进行了大量工作[5,4]。然而,人们对双锥形器件获得高功率和衍射极限输出的性质仍然知之甚少,迫切需要在设计上进行优化。
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