{"title":"Analog circuit testing","authors":"A. Hatzopoulos","doi":"10.1109/IMS3TW.2017.7995206","DOIUrl":null,"url":null,"abstract":"Although most of the integrated circuits in everyday applications surrounding us are digital, analog electronic circuits are still necessary, since the real world is analog and our human sensors and transmitters are also analog (ears, eyes, speech). Testing of these analog, mixedsignal and RF parts poses challenges quite different from those imposed by digital modules, while increasing considerably the cost of testing complex SoC. A set of analog circuit testing methods will be discussed. More specifically, the supply current testing method, the application of Wavelets and other techniques, and the classification-based testing will be described and their benefits versus the traditional specification-based test methods will be underlined.","PeriodicalId":115078,"journal":{"name":"2017 International Mixed Signals Testing Workshop (IMSTW)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 International Mixed Signals Testing Workshop (IMSTW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMS3TW.2017.7995206","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Although most of the integrated circuits in everyday applications surrounding us are digital, analog electronic circuits are still necessary, since the real world is analog and our human sensors and transmitters are also analog (ears, eyes, speech). Testing of these analog, mixedsignal and RF parts poses challenges quite different from those imposed by digital modules, while increasing considerably the cost of testing complex SoC. A set of analog circuit testing methods will be discussed. More specifically, the supply current testing method, the application of Wavelets and other techniques, and the classification-based testing will be described and their benefits versus the traditional specification-based test methods will be underlined.