A 65 nm 1.0 V 1.84 ns Silicon-on-Thin-Box (SOTB) embedded SRAM with 13.72 nW/Mbit standby power for smart IoT

M. Yabuuchi, K. Nii, S. Tanaka, Y. Shinozaki, Yoshiki Yamamoto, T. Hasegawa, H. Shinkawata, S. Kamohara
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引用次数: 3

Abstract

A 65-nm Silicon-on-Thin-Box (SOTB) embedded SRAM is demonstrated. By using back-bias (BB) control in the sleep mode, 13.72 nW/Mbit ultra-low standby power is observed, which is reduced to 1/1000 compared to the normal standby mode. The measured read access time with forward BB is 1.84 ns at 1.0 V overdrive and 25°C, which is improved by 60% and thus we achieved over 380 MHz operation. Up to 20% active read power reduction is also achieved by using proposed localized adoptive wordline width control.
一款65nm 1.0 V 1.84 ns SOTB嵌入式SRAM,待机功率为13.72 nW/Mbit,适用于智能物联网
展示了一种65nm薄盒硅(SOTB)嵌入式SRAM。通过在休眠模式下使用反向偏置(BB)控制,观察到13.72 nW/Mbit的超低待机功率,与正常待机模式相比降低到1/1000。在1.0 V超速和25°C下,前向BB的读访问时间为1.84 ns,提高了60%,因此我们实现了超过380 MHz的工作。通过采用所提出的局部自适应字线宽度控制,可将主动读功率降低20%。
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