T. Fujihira, K. Yoshida, T. Mizuno, K. Sakurai, Y. Uchida
{"title":"Self-isolation NMOS-DMOS technology for automotive low-side switches","authors":"T. Fujihira, K. Yoshida, T. Mizuno, K. Sakurai, Y. Uchida","doi":"10.1109/ISPSD.1991.146109","DOIUrl":null,"url":null,"abstract":"A self-isolation NMOS-DMOS technology has been developed and successfully applied to an automotive intelligent power MOSFET low-side switch. Though self-isolation technology provides a cost-effective approach for intelligent power switches (IPSs), there are strict limitations for usable device structures and device connections. The limitations are tightest in the case of low-side IPSs. To overcome these limitations, an over-temperature detection circuit, a current limiting circuit, a dynamic clamping circuit, and an electrostatic surge protection method have been developed for self-isolation low-side IPSs. The principles of these circuits and experimental results are presented together with an outline of self-isolation NMOS-DMOS technology. The applicability of self-isolation NMOS-DMOS technology to high voltage and/or IGBT (insulated-gate bipolar transistor) type IPSs is also demonstrated.<<ETX>>","PeriodicalId":127986,"journal":{"name":"[1991] Proceedings of the 3rd International Symposium on Power Semiconductor Devices and ICs","volume":"162 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Proceedings of the 3rd International Symposium on Power Semiconductor Devices and ICs","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1991.146109","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A self-isolation NMOS-DMOS technology has been developed and successfully applied to an automotive intelligent power MOSFET low-side switch. Though self-isolation technology provides a cost-effective approach for intelligent power switches (IPSs), there are strict limitations for usable device structures and device connections. The limitations are tightest in the case of low-side IPSs. To overcome these limitations, an over-temperature detection circuit, a current limiting circuit, a dynamic clamping circuit, and an electrostatic surge protection method have been developed for self-isolation low-side IPSs. The principles of these circuits and experimental results are presented together with an outline of self-isolation NMOS-DMOS technology. The applicability of self-isolation NMOS-DMOS technology to high voltage and/or IGBT (insulated-gate bipolar transistor) type IPSs is also demonstrated.<>