{"title":"Increase reliability for screening by coating plastic parts","authors":"A. Morrison","doi":"10.1109/RAMS.2002.981712","DOIUrl":null,"url":null,"abstract":"The selection of components for computer integrated circuits (ICs) has been a major reliability problem in the past few years. The author argues that the present approach of using plastic ICs in MIL designs without a moisture barrier to correct possible package defects is a major risk. Vendor data for the reliability prediction value is usually overstated and may effect expected results of reliability testing. He details how screening reliability can be increased by the use of coated plastic parts.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"695 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2002.981712","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The selection of components for computer integrated circuits (ICs) has been a major reliability problem in the past few years. The author argues that the present approach of using plastic ICs in MIL designs without a moisture barrier to correct possible package defects is a major risk. Vendor data for the reliability prediction value is usually overstated and may effect expected results of reliability testing. He details how screening reliability can be increased by the use of coated plastic parts.