SEU data and fault tolerance analysis of a LEON 3FT processor

2009 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2009-09-01 DOI:10.1109/RADECS.2009.5994733

A. Jordan, C. Hafer, J. Mabra, S. Griffith, J. Nagy, M. Lahey, D. Harris

引用次数: 5

Abstract

Single-bit per word error protection is implemented on this LEON 3 fault tolerant processor. SEU data is reviewed and fault analysis is examined based on processor operation and operational environment.

查看原文本刊更多论文

LEON 3FT处理器的SEU数据和容错分析

在该LEON 3容错处理器上实现了每字单比特的错误保护。根据处理器的运行情况和运行环境，对SEU数据进行审查，并进行故障分析。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

2009 European Conference on Radiation and Its Effects on Components and Systems

自引率

0.00%

发文量