Long term ageing changes in structure and morphology of nanocrystalline ZnxCd1−xSe thin films

I. Bineva, T. Hristova-Vassileva, B. Pejova, D. Nesheva, Z. Levi, Z. Aneva
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Abstract

Long term morphological and structural changes of ZnxCd1-xSe (x=0.4, 0.6 and 0.8) thin films, obtained by solid state alloying of consecutively deposited submonolayers of ZnSe and CdSe, were investigated by means of Atomic Force Microscopy (AFM) and X-ray diffraction (XRD). The XRD investigations show typical solid solution patterns without any decomposition. A relaxation of the lattice is observed through the years, showing tendency towards thermodynamic equilibrium. A. non-uniform strain is observed for x= 0.4 and 0.8, which is proven by the AFM measurements to be due to structural defects. 2D fast Fourrier transform patterns are derived from the AFM images and grain structure evolution and various morphological changes occurring in the films with time are observed and discussed.
ZnxCd1−xSe纳米晶薄膜的结构和形貌的长期老化变化
利用原子力显微镜(AFM)和x射线衍射仪(XRD)研究了连续沉积ZnSe和CdSe亚单层的固态合金化制备的ZnxCd1-xSe (x=0.4、0.6和0.8)薄膜的长期形态和结构变化。XRD研究表明,该材料具有典型的固溶体形态,没有任何分解。多年来观察到晶格的松弛,显示出趋向热力学平衡的趋势。A.在x= 0.4和0.8时观察到非均匀应变,通过AFM测量证明这是由于结构缺陷造成的。从原子力显微镜图像中导出了二维快速傅里叶变换图,并观察和讨论了薄膜中晶粒结构随时间的演变和各种形态变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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