R. Fornari, A. Zappettini, E. Gombia, R. Mosca, M. Curti
{"title":"Annealing-related conductivity conversion in lightly Fe-doped n-type InP wafers","authors":"R. Fornari, A. Zappettini, E. Gombia, R. Mosca, M. Curti","doi":"10.1109/SIM.1996.570865","DOIUrl":null,"url":null,"abstract":"As-grown semiconducting InP wafers containing iron at a level between 5 and 8/spl times/10/sup 15/ cm/sup -3/ were seen to convert to semi-insulating, with high resistivity and good mobility, after a thermal treatment at 900/spl deg/C. This fact is interesting since it allows the preparation of semi-insulating InP with Fe content substantially lower than in standard LEC material. In this paper we report the annealing parameters and the results of an extensive electro-optical characterization of the treated samples. The experimental results suggest that the conductivity drop is mainly due to a considerable loss of shallow donors.","PeriodicalId":391894,"journal":{"name":"Proceedings of Semiconducting and Semi-Insulating Materials Conference","volume":"159 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Semiconducting and Semi-Insulating Materials Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIM.1996.570865","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
As-grown semiconducting InP wafers containing iron at a level between 5 and 8/spl times/10/sup 15/ cm/sup -3/ were seen to convert to semi-insulating, with high resistivity and good mobility, after a thermal treatment at 900/spl deg/C. This fact is interesting since it allows the preparation of semi-insulating InP with Fe content substantially lower than in standard LEC material. In this paper we report the annealing parameters and the results of an extensive electro-optical characterization of the treated samples. The experimental results suggest that the conductivity drop is mainly due to a considerable loss of shallow donors.