{"title":"New efficient method of modeling electronics packages with power and ground planes","authors":"Weimin Shi, J. Fang","doi":"10.1109/EPEP.2001.967654","DOIUrl":null,"url":null,"abstract":"This paper introduces a new efficient numerical technique for the computation of fields in electronics packages with power and ground planes. This full wave approach can be conveniently integrated with circuit solvers. Skin-effect loss from metal planes and dielectric loss, together with the non-total reflections from outer edges of planes, can be easily incorporated. A special computation scheme was developed for handling vias between metal planes. Very good correlation has been achieved on printed-circuit test boards up to several GHz.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"127 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2001.967654","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
This paper introduces a new efficient numerical technique for the computation of fields in electronics packages with power and ground planes. This full wave approach can be conveniently integrated with circuit solvers. Skin-effect loss from metal planes and dielectric loss, together with the non-total reflections from outer edges of planes, can be easily incorporated. A special computation scheme was developed for handling vias between metal planes. Very good correlation has been achieved on printed-circuit test boards up to several GHz.