Research of the Program Injection Method for Determing the SEFI Cross Section of STM32 Microcontroller

E.S. Makhinov, A. Egorov, I. Loskutov, P. V. Nekrasov
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Abstract

The program injection method is an applied solution to the problem determining the Single Event Function Interrupt (SEFI) cross section of MCU for any program used. Each program is characterized by its number of critical bits. Under the influence of single ionzing particles on these memory bits a SEFI occurs. The program injection method allows studying crititcal bits of the program while using only accessible to the programmer memory areas. Bits that are not available for direct study by the method are located in a protected area of the memory and the core of the MCU. To take them into account, it is necessary to know the dependence of the SEFI cross section on the number of critical bits.
STM32单片机SEFI截面测定的程序注入方法研究
程序注入方法是一种实用的解决方案,用于确定任何程序使用的单片机的单事件函数中断(SEFI)横截面。每个程序都有其关键位的数量。在单个电离粒子对这些存储位元的影响下,发生了SEFI。程序注入方法允许研究程序的关键位,而只使用程序员可访问的内存区域。不能用该方法直接研究的位位于存储器和MCU核心的保护区域。为了考虑它们,有必要知道SEFI横截面对临界比特数的依赖性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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