D. Maljar, D. Arbet, M. Kovác, R. Ondica, V. Stopjaková
{"title":"Autocalibration Approach for Improving Robustness of Analog ICs","authors":"D. Maljar, D. Arbet, M. Kovác, R. Ondica, V. Stopjaková","doi":"10.1109/ddecs54261.2022.9770155","DOIUrl":null,"url":null,"abstract":"This work presents a dedicated method of analog integrated circuit (IC) autocalibration, which was used to calibrate a voltage reference with the output voltage value of 96 mV . The reference accuracy might be significantly influenced by fluctuations in the manufacturing process. The essence of this technique is to suppress this undesired influence of process variations in terms of the corner conditions of 130 nm CMOS technology. All analog parts of the proposed autocalibration system are presented at the transistor level. The output of the calibration subcircuit is a digital signal controlling the autocalibration.","PeriodicalId":334461,"journal":{"name":"2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ddecs54261.2022.9770155","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This work presents a dedicated method of analog integrated circuit (IC) autocalibration, which was used to calibrate a voltage reference with the output voltage value of 96 mV . The reference accuracy might be significantly influenced by fluctuations in the manufacturing process. The essence of this technique is to suppress this undesired influence of process variations in terms of the corner conditions of 130 nm CMOS technology. All analog parts of the proposed autocalibration system are presented at the transistor level. The output of the calibration subcircuit is a digital signal controlling the autocalibration.