Autocalibration Approach for Improving Robustness of Analog ICs

D. Maljar, D. Arbet, M. Kovác, R. Ondica, V. Stopjaková
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Abstract

This work presents a dedicated method of analog integrated circuit (IC) autocalibration, which was used to calibrate a voltage reference with the output voltage value of 96 mV . The reference accuracy might be significantly influenced by fluctuations in the manufacturing process. The essence of this technique is to suppress this undesired influence of process variations in terms of the corner conditions of 130 nm CMOS technology. All analog parts of the proposed autocalibration system are presented at the transistor level. The output of the calibration subcircuit is a digital signal controlling the autocalibration.
一种提高模拟集成电路鲁棒性的自动校准方法
本文提出了一种专用的模拟集成电路(IC)自动校准方法,用于校准输出电压值为96 mV的基准电压。参考精度可能会受到制造过程波动的显著影响。该技术的本质是在130纳米CMOS技术的拐角条件下抑制这种不希望的工艺变化的影响。所提出的自动校准系统的所有模拟部分都是在晶体管级提出的。校准子电路的输出是控制自动校准的数字信号。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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