Defect-Oriented Test for Ultra-Low DPM

Abstract

Business demand for ultra-low defects-permillion (DPM) levels and the emergence of subtle defects that often manifest as functional errors only in the presence of certain specific environmental conditions such as crosstalk, have led to a critical need for intelligent, adaptive, and targeted defectoriented test. The classical model of test, in which integrated circuits (ICs) are subjected to a blanket suite of stuck-fault, transition and Iddq test patterns generated without consideration to layout and chip-to-chip differences are now insufficient to bring DPM levels for cutting-edge ICs down to the requisite 10-100 range demanded by qualityconscious customers.