{"title":"A 1ps-Resolution Jitter-Measurement Macro Using Interpolated Jitter Oversampling","authors":"K. Nose, M. Kajita, M. Mizuno","doi":"10.1109/ISSCC.2006.1696271","DOIUrl":null,"url":null,"abstract":"An in-field real-time successive jitter-measurement macro is developed. It features interpolated jitter oversampling and feedforward calibration that help attain 1ps resolution and a hierarchical Vernier jitter-measurement technique that exploits the trade-off between rms and deterministic jitter measurement characteristics","PeriodicalId":166617,"journal":{"name":"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"66","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2006.1696271","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 66
Abstract
An in-field real-time successive jitter-measurement macro is developed. It features interpolated jitter oversampling and feedforward calibration that help attain 1ps resolution and a hierarchical Vernier jitter-measurement technique that exploits the trade-off between rms and deterministic jitter measurement characteristics