Taiwan test industry session: value added testing in the new millennium

Chung-Len Lee
{"title":"Taiwan test industry session: value added testing in the new millennium","authors":"Chung-Len Lee","doi":"10.1109/ATS.2000.893594","DOIUrl":null,"url":null,"abstract":"In the last two decades of the 20th century, the integrated circuit (IC) industry has prolonged and redefined Taiwan Economic Miracle. The relay has passed from OEM to IDM then to the foundry services. With the strong supports from the foundry and manufacturing sectors, the energetic and creative design sector has seen an unsurpassed opportunity in the new Millennium. The design sector will continue the trend and create a new horizon. The shift in the paradigm will have a significant impact on the test sector. In the Taiwan Test Industry Session, we will discuss how the test sector shall react, what the emerging technologies are, and what the new business protocol should be. We have invited distinguished members from designer, test, and ATE sectors to express their inside views. f The experts from design sectors will present their problems and requirements in the deep sub-micron circuit testing. The expert from the test sectors will present their current capability and technology roadmap regarding the technical concerns. Finally, ATE venders will showcase their advanced machine in the New Millennium to tackle the problems. Technology wise, the testing of System on Chip, System in Package, mixed signal, RF, and signal integrity are some of the issues that will be discussed. Infrastructure wise, the protocol for the technical cooperation on the test development in the circuit design stage and the model for the business operation in the final test stage are the focus of the presentations.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Ninth Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2000.893594","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

In the last two decades of the 20th century, the integrated circuit (IC) industry has prolonged and redefined Taiwan Economic Miracle. The relay has passed from OEM to IDM then to the foundry services. With the strong supports from the foundry and manufacturing sectors, the energetic and creative design sector has seen an unsurpassed opportunity in the new Millennium. The design sector will continue the trend and create a new horizon. The shift in the paradigm will have a significant impact on the test sector. In the Taiwan Test Industry Session, we will discuss how the test sector shall react, what the emerging technologies are, and what the new business protocol should be. We have invited distinguished members from designer, test, and ATE sectors to express their inside views. f The experts from design sectors will present their problems and requirements in the deep sub-micron circuit testing. The expert from the test sectors will present their current capability and technology roadmap regarding the technical concerns. Finally, ATE venders will showcase their advanced machine in the New Millennium to tackle the problems. Technology wise, the testing of System on Chip, System in Package, mixed signal, RF, and signal integrity are some of the issues that will be discussed. Infrastructure wise, the protocol for the technical cooperation on the test development in the circuit design stage and the model for the business operation in the final test stage are the focus of the presentations.
台湾测试产业会议:新千年的增值测试
在20世纪的最后二十年里,集成电路产业延长并重新定义了台湾的经济奇迹。从OEM到IDM再到代工服务。在铸造厂和制造业的大力支持下,充满活力和创意的设计行业在新千年中迎来了无与伦比的机遇。设计领域将继续这一趋势,并创造一个新的视野。范式的转变将对测试部门产生重大影响。在台湾测试产业会议中,我们将讨论测试部门如何应对,新兴技术是什么,以及新的业务协议应该是什么。我们邀请了来自设计、测试和ATE领域的杰出人士发表他们的内部观点。f来自设计领域的专家将介绍他们在深亚微米电路测试中的问题和要求。来自测试部门的专家将介绍他们目前的能力和有关技术问题的技术路线图。最后,ATE厂商将展示他们在新千年的先进机器来解决这些问题。技术方面,片上系统、包中系统、混合信号、射频和信号完整性的测试是将讨论的一些问题。在基础设施方面,电路设计阶段测试开发的技术合作协议和最终测试阶段的业务操作模型是演示的重点。
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