No-clean And Water-clean Mass Reflow Processes Of 0.4 mm Pitch, 256-Pin Fine Pitch Quad Flat Packs (QFP)

John H. Lau, R. Govila, C. Larner, Y. Pao, S. Erasmus, S. Dolot, V. Solberg
{"title":"No-clean And Water-clean Mass Reflow Processes Of 0.4 mm Pitch, 256-Pin Fine Pitch Quad Flat Packs (QFP)","authors":"John H. Lau, R. Govila, C. Larner, Y. Pao, S. Erasmus, S. Dolot, V. Solberg","doi":"10.1109/IEMT.1992.639909","DOIUrl":null,"url":null,"abstract":"The water-clean and no-clean mass reflow processes of the 0.4 mm pitch, 28 mm body size, and 256-Pin fine pitch quad flat packs (QFP) are presented. Emphasis is placed on the fine pitch parameters such as the printed circuit board (PCB) design, solder paste selection, stencil design, printing technology, component placement, mass reflow, and cleaning. Furthermore, the cross sections of the assemblies from both processes have been thoroughly studied using scanning electron microscopy (SEM).","PeriodicalId":403090,"journal":{"name":"Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium","volume":"175 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1992.639909","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The water-clean and no-clean mass reflow processes of the 0.4 mm pitch, 28 mm body size, and 256-Pin fine pitch quad flat packs (QFP) are presented. Emphasis is placed on the fine pitch parameters such as the printed circuit board (PCB) design, solder paste selection, stencil design, printing technology, component placement, mass reflow, and cleaning. Furthermore, the cross sections of the assemblies from both processes have been thoroughly studied using scanning electron microscopy (SEM).
0.4 mm间距,256针细间距四平面封装(QFP)的非清洁和水清洁批量回流工艺
介绍了0.4 mm间距、28 mm机身尺寸和256引脚细间距四平面封装(QFP)的水清洁和非清洁质量回流工艺。重点放在细间距参数,如印刷电路板(PCB)的设计,锡膏的选择,模具的设计,印刷技术,元件的放置,大量回流和清洗。此外,通过扫描电子显微镜(SEM)对两种工艺的组件的横截面进行了彻底的研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信