{"title":"Coaxial deflectometry: absolute shape measurement with interferometric accuracy","authors":"Y. Surrel, M. Bordoux","doi":"10.1117/12.2673699","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Measurement Systems for Industrial Inspection XIII","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2673699","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}