Materials and mechanics issues in flip-chip organic packaging

T. Wu, Y. Tsukada, W.T. Chen
{"title":"Materials and mechanics issues in flip-chip organic packaging","authors":"T. Wu, Y. Tsukada, W.T. Chen","doi":"10.1109/ECTC.1996.517439","DOIUrl":null,"url":null,"abstract":"The strength of flip chip organic packaging technology rests upon the knowledge and manufacturing base of C4 solder bump chip interconnection, and printed circuit technology infrastructure. The key innovation was the underfill encapsulation between the chip and the laminate which overcame the road-block of low cycle fatigue of C4 solder bump due to large CTE difference between silicon and laminate. The advent of SLC (surface laminar circuit) innovation extends the flip chip technology to higher solder bump density and larger chip I/O expected for future generations of semiconductors. The flip chip packages contain new materials, interfaces, and new processes which in turn govern the mechanical integrity of the packaging module and module card assembly. The increasing pervasiveness of electronic packages requires meeting new sets of environments. It is important to have a good understanding of materials, interface, metrology and mechanics issues related to organic packages, and how to apply this understanding in the modelling of design, process and reliability of flip chip. This paper will deliver an overview of some of the key technical challenges associated with materials and mechanics in FCA (flip-chip attach) assembly on organic carriers.","PeriodicalId":143519,"journal":{"name":"1996 Proceedings 46th Electronic Components and Technology Conference","volume":"137 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"101","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 Proceedings 46th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1996.517439","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 101

Abstract

The strength of flip chip organic packaging technology rests upon the knowledge and manufacturing base of C4 solder bump chip interconnection, and printed circuit technology infrastructure. The key innovation was the underfill encapsulation between the chip and the laminate which overcame the road-block of low cycle fatigue of C4 solder bump due to large CTE difference between silicon and laminate. The advent of SLC (surface laminar circuit) innovation extends the flip chip technology to higher solder bump density and larger chip I/O expected for future generations of semiconductors. The flip chip packages contain new materials, interfaces, and new processes which in turn govern the mechanical integrity of the packaging module and module card assembly. The increasing pervasiveness of electronic packages requires meeting new sets of environments. It is important to have a good understanding of materials, interface, metrology and mechanics issues related to organic packages, and how to apply this understanding in the modelling of design, process and reliability of flip chip. This paper will deliver an overview of some of the key technical challenges associated with materials and mechanics in FCA (flip-chip attach) assembly on organic carriers.
倒装有机封装中的材料与力学问题
倒装有机封装技术的实力取决于C4凸点芯片互连的知识和制造基础,以及印刷电路技术基础设施。关键的创新是芯片和层压板之间的下填充封装,克服了由于硅和层压板之间CTE差异大而导致C4焊点低周疲劳的障碍。SLC(表面层流电路)创新的出现将倒装芯片技术扩展到更高的焊点密度和更大的芯片I/O,预计将用于未来几代半导体。倒装晶片封装包含新材料、接口和新工艺,它们反过来又控制封装模块和模块卡组件的机械完整性。电子封装的日益普及需要满足新的环境。了解与有机封装相关的材料,界面,计量和力学问题,以及如何将这些理解应用于倒装芯片的设计,工艺和可靠性建模是很重要的。本文将概述有机载流子上FCA(倒装芯片)组装中与材料和力学相关的一些关键技术挑战。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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