{"title":"Highly automated and efficient simulation environment with UVM","authors":"Hung-Yi Yang","doi":"10.1109/VLSI-DAT.2014.6834923","DOIUrl":null,"url":null,"abstract":"As design becomes more and more complicated, functional verification is getting challenging than ever. The challenges come in twofold: verification is taking longer to finish and difficult to catch all functional errors. Surveys[1] shown that functional error has been the number one reason for re-spin. How well verification is done becomes a very important issue. Re-spin not only can cost a lot due to advancing of manufacturing process but also delays the time to market which could be even more costly than re-spin itself. In order to tackle these two challenges, industry has come up with a solution called Universal Verification Methodology (UVM)[2] in recent years. But even with UVM which standardized the way for designing testbench, a simulation environment has to be well designed to take advantage of UVM and provide management of running large amount of simulations/regression in an efficient way.","PeriodicalId":267124,"journal":{"name":"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI-DAT.2014.6834923","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
As design becomes more and more complicated, functional verification is getting challenging than ever. The challenges come in twofold: verification is taking longer to finish and difficult to catch all functional errors. Surveys[1] shown that functional error has been the number one reason for re-spin. How well verification is done becomes a very important issue. Re-spin not only can cost a lot due to advancing of manufacturing process but also delays the time to market which could be even more costly than re-spin itself. In order to tackle these two challenges, industry has come up with a solution called Universal Verification Methodology (UVM)[2] in recent years. But even with UVM which standardized the way for designing testbench, a simulation environment has to be well designed to take advantage of UVM and provide management of running large amount of simulations/regression in an efficient way.