{"title":"Analysis of InAs-Si heterojunction nanowire tunnel FETs: Extreme confinement vs. bulk","authors":"H. Carrillo-Nuñez, M. Luisier, A. Schenk","doi":"10.1109/ESSDERC.2014.6948772","DOIUrl":null,"url":null,"abstract":"Extremely narrow and bulk-like p-type InAs-Si nanowire TFETs are studied using a full-band and atomistic quantum transport simulator based on the sp3d5s* tight-binding model and a drift-diffusion TCAD tool. As third option, the WKB approximation has been adapted to work in heterostructures through a careful choice of the imaginary dispersion. It is found that for ultra-scaled InAs-Si nanowire TFETs, the WKB approximation and the quantum transport results agree very well, suggesting that the former could be applied to larger hetero-TFET structures and considerably reduce the simulation time while keeping a high accuracy.","PeriodicalId":262652,"journal":{"name":"2014 44th European Solid State Device Research Conference (ESSDERC)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 44th European Solid State Device Research Conference (ESSDERC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2014.6948772","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
Extremely narrow and bulk-like p-type InAs-Si nanowire TFETs are studied using a full-band and atomistic quantum transport simulator based on the sp3d5s* tight-binding model and a drift-diffusion TCAD tool. As third option, the WKB approximation has been adapted to work in heterostructures through a careful choice of the imaginary dispersion. It is found that for ultra-scaled InAs-Si nanowire TFETs, the WKB approximation and the quantum transport results agree very well, suggesting that the former could be applied to larger hetero-TFET structures and considerably reduce the simulation time while keeping a high accuracy.