{"title":"Processing technologies for SiC","authors":"G. Constantinidis","doi":"10.1109/SMICND.1997.651571","DOIUrl":null,"url":null,"abstract":"Processing steps such as polishing, thermal oxidation, ion implantation, ohmic contacts, Schottky contacts and patterning are key issues for the successful fabrication of SiC-power devices and high temperature devices. This paper reviews contact fabrication and patterning with the emphasis on reactive ion etching.","PeriodicalId":144314,"journal":{"name":"1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.1997.651571","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Processing steps such as polishing, thermal oxidation, ion implantation, ohmic contacts, Schottky contacts and patterning are key issues for the successful fabrication of SiC-power devices and high temperature devices. This paper reviews contact fabrication and patterning with the emphasis on reactive ion etching.