Physics-of-failure: an approach to reliable product development

Michael Pecht, Abhijit Dasgupta
{"title":"Physics-of-failure: an approach to reliable product development","authors":"Michael Pecht, Abhijit Dasgupta","doi":"10.1109/IRWS.1995.493566","DOIUrl":null,"url":null,"abstract":"Reliability assessments based on physics-of-failure methods incorporate reliability into the design process to prevent parts from failing in service. An understanding of the physics-of-failure is necessary in applications which afford little opportunity for testing, or for reliability growth. This paper presents an overview of physics-of-failure and a case study of the application of physics-of-failure to a specific failure mechanism called conductive filament formation.","PeriodicalId":355898,"journal":{"name":"IEEE 1995 International Integrated Reliability Workshop. Final Report","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"175","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1995 International Integrated Reliability Workshop. Final Report","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRWS.1995.493566","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 175

Abstract

Reliability assessments based on physics-of-failure methods incorporate reliability into the design process to prevent parts from failing in service. An understanding of the physics-of-failure is necessary in applications which afford little opportunity for testing, or for reliability growth. This paper presents an overview of physics-of-failure and a case study of the application of physics-of-failure to a specific failure mechanism called conductive filament formation.
失效物理:一种可靠的产品开发方法
基于失效物理方法的可靠性评估将可靠性纳入设计过程,以防止零件在使用中失效。在很少有机会进行测试或提高可靠性的应用程序中,了解故障的物理性质是必要的。本文介绍了失效物理的概述和失效物理应用于称为导电丝形成的特定失效机制的案例研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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