{"title":"A new high energy implantation based technology for power integrated circuit devices","authors":"D. Patti, G. Franzò, V. Privitera, F. Priolo","doi":"10.1109/ISPSD.1999.764127","DOIUrl":null,"url":null,"abstract":"In this work, a significant improvement of power integrated circuit technology has been obtained by the use of high energy implantation, thus eliminating a second epitaxial growth. The damage in implanted region has been recovered by rapid thermal annealing.","PeriodicalId":352185,"journal":{"name":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","volume":"417 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1999.764127","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this work, a significant improvement of power integrated circuit technology has been obtained by the use of high energy implantation, thus eliminating a second epitaxial growth. The damage in implanted region has been recovered by rapid thermal annealing.