A. Emamjomeh, P. Wesling, J. Doong, A. Chi, K. Ling, S. Chiao
{"title":"TAB inner-lead bond process characterization for single-point laser bonding","authors":"A. Emamjomeh, P. Wesling, J. Doong, A. Chi, K. Ling, S. Chiao","doi":"10.1109/IEMT.1991.279738","DOIUrl":null,"url":null,"abstract":"Results are presented for a set of screening experiments used to characterize a process for performing inner-lead bonding (ILB) using a continuous-wave (CW) laser. Three key parameters were selected for initial analysis: the force exerted by the bonding stylus; the laser power; and the on-time of the laser. Using a Box-Behnken statistical design for the experiment, an efficient set of tests was derived. Four sets of experimental samples were fabricated, to be used for the as-fabricated testing, high-temperature aging, and thermal cycling. Only the as-fabricated results are reported here. Using a design-of-experiments software package for the PC, a quadratic equation was derived from the data explicitly defining the relationships among the three parameters and relating them to bond strength. Using the techniques of surface response methodology, a response surface was created, showing the optimum operating region for the ILB process based on the parameter range chosen. The initial screening experiments show that good bond strength occurs in a range of constant energy (power times on-time) for the CW laser bonder; in the range of the three parameters tested, bond strength was optimized at forces of 20 grams, a power of 4.3 W, and laser on-time of 150 ms.<<ETX>>","PeriodicalId":127257,"journal":{"name":"[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1991.279738","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
Results are presented for a set of screening experiments used to characterize a process for performing inner-lead bonding (ILB) using a continuous-wave (CW) laser. Three key parameters were selected for initial analysis: the force exerted by the bonding stylus; the laser power; and the on-time of the laser. Using a Box-Behnken statistical design for the experiment, an efficient set of tests was derived. Four sets of experimental samples were fabricated, to be used for the as-fabricated testing, high-temperature aging, and thermal cycling. Only the as-fabricated results are reported here. Using a design-of-experiments software package for the PC, a quadratic equation was derived from the data explicitly defining the relationships among the three parameters and relating them to bond strength. Using the techniques of surface response methodology, a response surface was created, showing the optimum operating region for the ILB process based on the parameter range chosen. The initial screening experiments show that good bond strength occurs in a range of constant energy (power times on-time) for the CW laser bonder; in the range of the three parameters tested, bond strength was optimized at forces of 20 grams, a power of 4.3 W, and laser on-time of 150 ms.<>