Formatting and numerical processing of irradiation tests results

Abstract

Within the context of the implementation of a new data-base of electronic component vulnerability to radiation, complementary tools making data collecting and processing easier are presented. Reliability of data included in the base is achieved with: a standardization of total dose, neutron fluence and dose rate, test procedures; a standardization of test report presentation; a verification and a digital processing of experimental results before their transfer in the base. The pertinence of information obtained by this means enables an empirical and statistical analysis of the behaviour of the various component families, serving to define design rules of systems that have to resist a tactical nuclear aggression. This approach is illustrated with examples concerning the cumulative damage measured on 151 operational amplifiers in neutron fluence and on 70 MOS transistors in total dose, as well as the threshold effect existing in CMOS/bulk integrated circuits in dose rate on 226 components. Thanks to this analysis, the accumulation of test data should enable us to extract, by family, the characteristics representative of radiation effects, as well as their distribution law.