An Improved Algorithm to Identify the Test Stimulus in Histogram-Based A/D Converter Testing

Abstract

This paper presents an improved stimulus identification algorithm for histogram-based A/D converter testing. The mathematical theory behind the improvements is described and simulation results supporting this theory are presented. The stimulus identification method enables the linearity of ADCs to be tested without a highly linear or pure test stimulus. Simulations predict that the INL of 16-b ADCs can be measured with an accuracy of 0.5 LSB using only a 75 dBc pure sinusoidal test stimulus, whereas the standardized histogram test method requires a pure test stimulus of over 105 dBc.