{"title":"A visually oriented architectural fault simulation environment for WSI","authors":"P. Ryan, D. Saab, W. Kent Fuchs","doi":"10.1109/ICWSI.1990.63898","DOIUrl":null,"url":null,"abstract":"A visually oriented fault simulation environment for WSI architectures based on behavioral simulation of parallel message passing processors and switch-level fault simulation of selected processors is described. The environment was implemented by interfacing the CHAMP switch-level simulator with the OODRA behavioral simulator. The simulation environment was used to measure the fault coverage for a digital adaptive beamforming architecture with a synthetic workload. Fault coverage variation with input set size and array location was investigated. The rate at which faults produce errors in the architecture was also measured.<<ETX>>","PeriodicalId":206140,"journal":{"name":"1990 Proceedings. International Conference on Wafer Scale Integration","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1990 Proceedings. International Conference on Wafer Scale Integration","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICWSI.1990.63898","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A visually oriented fault simulation environment for WSI architectures based on behavioral simulation of parallel message passing processors and switch-level fault simulation of selected processors is described. The environment was implemented by interfacing the CHAMP switch-level simulator with the OODRA behavioral simulator. The simulation environment was used to measure the fault coverage for a digital adaptive beamforming architecture with a synthetic workload. Fault coverage variation with input set size and array location was investigated. The rate at which faults produce errors in the architecture was also measured.<>