{"title":"Electromagnetic simulation challenges in RFIC design","authors":"J. M. Carroll, J. Dunn","doi":"10.1109/SIRF.2016.7445474","DOIUrl":null,"url":null,"abstract":"Electromagnetic (EM) simulation and modeling are a growing and indispensable part of the Radio Frequency Integrated Circuit (RFIC) design industry. The percentage of EM simulation content in high-frequency designs is continually increasing to the level where examples of full chip simulation are becoming more common. The growth of EM simulations in the RF design flow creates many significant challenges and the need for potential future improvements.","PeriodicalId":138697,"journal":{"name":"2016 IEEE 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIRF.2016.7445474","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Electromagnetic (EM) simulation and modeling are a growing and indispensable part of the Radio Frequency Integrated Circuit (RFIC) design industry. The percentage of EM simulation content in high-frequency designs is continually increasing to the level where examples of full chip simulation are becoming more common. The growth of EM simulations in the RF design flow creates many significant challenges and the need for potential future improvements.