Prediction of temperature cycling life for SMT solder joints on TCE-mismatched substrates

D. Riemer
{"title":"Prediction of temperature cycling life for SMT solder joints on TCE-mismatched substrates","authors":"D. Riemer","doi":"10.1109/ECTC.1990.122224","DOIUrl":null,"url":null,"abstract":"A method for the prediction of solder-joint cycle life in surface-mount assemblies is presented. It is based on the conversion of plastic solder shear strain into cycle life with an equation derived by W. Engelmaier (1983). The shear strain is normally calculated from temperature and TCE (thermal coefficient of expansion) differentials between the package and interconnect board without consideration of elastic deformations. The suggested method derives the average plastic shear strain of the solder joint at the maximum temperature excursion from the finite-element analysis of a simple model that consists of the interconnect board, a solder joint, and the package. All materials in the model have linear (elastic) properties, except solder, which has nonlinear (elastic/plastic) characteristics. The solder joint is modeled as single finite element so that only one value is computed for the plastic shear strain in the solder joint. This value represents the average shear strain, which is converted into solder-joint cycle life. The cycle life predictions with the finite-element method are confirmed by cycling results obtained on actual hardware.<<ETX>>","PeriodicalId":102875,"journal":{"name":"40th Conference Proceedings on Electronic Components and Technology","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"38","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"40th Conference Proceedings on Electronic Components and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1990.122224","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 38

Abstract

A method for the prediction of solder-joint cycle life in surface-mount assemblies is presented. It is based on the conversion of plastic solder shear strain into cycle life with an equation derived by W. Engelmaier (1983). The shear strain is normally calculated from temperature and TCE (thermal coefficient of expansion) differentials between the package and interconnect board without consideration of elastic deformations. The suggested method derives the average plastic shear strain of the solder joint at the maximum temperature excursion from the finite-element analysis of a simple model that consists of the interconnect board, a solder joint, and the package. All materials in the model have linear (elastic) properties, except solder, which has nonlinear (elastic/plastic) characteristics. The solder joint is modeled as single finite element so that only one value is computed for the plastic shear strain in the solder joint. This value represents the average shear strain, which is converted into solder-joint cycle life. The cycle life predictions with the finite-element method are confirmed by cycling results obtained on actual hardware.<>
tce不匹配基板上SMT焊点温度循环寿命的预测
提出了一种预测表面贴装组件焊点循环寿命的方法。它是基于用W. Engelmaier(1983)导出的公式将塑料焊料剪切应变转换为循环寿命。剪切应变通常由封装和互连板之间的温度和热膨胀系数(TCE)差来计算,而不考虑弹性变形。该方法通过对由互连板、焊点和封装组成的简单模型进行有限元分析,得出焊点在最大温度偏移时的平均塑性剪切应变。模型中的所有材料都具有线性(弹性)特性,除了焊料具有非线性(弹性/塑性)特性。将焊点建模为单个有限元,从而只计算一个焊点的塑性剪切应变值。该值表示平均剪切应变,并将其转化为焊点循环寿命。用有限元法预测的循环寿命通过在实际硬件上得到的循环结果得到了验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
CiteScore
3.10
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信