Ayumu Yamada, Naoko Misawa, C. Matsui, Ken Takeuchi
{"title":"ReRAM CiM Fluctuation Pattern Classification by CNN Trained on Artificially Created Dataset","authors":"Ayumu Yamada, Naoko Misawa, C. Matsui, Ken Takeuchi","doi":"10.1109/IRPS48203.2023.10118305","DOIUrl":null,"url":null,"abstract":"A CNN-based Fluctuation Pattern Classifier (FPC) is proposed. FPC is fully trained on the artificially created dataset with assumed fluctuation patterns such as random telegraph noise (RTN) and Oxygen Vacancy movement. FPC is applied to the measured ReRAM signals under different write conditions before read cycles and physical models are established based on the classification results. Proposed fluctuation reduction write (FRW) reduces ReRAM fluctuation rate by 35.1% to improve the inference accuracy of neural network.","PeriodicalId":159030,"journal":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS48203.2023.10118305","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A CNN-based Fluctuation Pattern Classifier (FPC) is proposed. FPC is fully trained on the artificially created dataset with assumed fluctuation patterns such as random telegraph noise (RTN) and Oxygen Vacancy movement. FPC is applied to the measured ReRAM signals under different write conditions before read cycles and physical models are established based on the classification results. Proposed fluctuation reduction write (FRW) reduces ReRAM fluctuation rate by 35.1% to improve the inference accuracy of neural network.