{"title":"Nondestructive, X-Ray Inspection of Ceramic-Chip Capacitors for Delaminations","authors":"R. Spriggs, A. Cronshagen","doi":"10.1109/IRPS.1976.362736","DOIUrl":null,"url":null,"abstract":"A radiographic method has been devised and successfully applied to the detection of delaminations in small ceramic-chip capacitors. The results indicate that this nondestructive technique is suitable for sampling or 100% screening of lots. The radiograph provides an integrated image of internal structure rather than a view of just one plane as in cross sectioning. It requires proper alignment of chips in the x-ray beam, and readily detects voids of at least 0.001-inch width that extend more than 30% of the depth of the capacitor. Life tests of radiographically graded parts showed a high correlation with physical-sectioning results and with capacitor failure rates.","PeriodicalId":428300,"journal":{"name":"14th International Reliability Physics Symposium","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1976-04-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"14th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1976.362736","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
A radiographic method has been devised and successfully applied to the detection of delaminations in small ceramic-chip capacitors. The results indicate that this nondestructive technique is suitable for sampling or 100% screening of lots. The radiograph provides an integrated image of internal structure rather than a view of just one plane as in cross sectioning. It requires proper alignment of chips in the x-ray beam, and readily detects voids of at least 0.001-inch width that extend more than 30% of the depth of the capacitor. Life tests of radiographically graded parts showed a high correlation with physical-sectioning results and with capacitor failure rates.