{"title":"The ES/9000 glass ceramic thermal conduction module, design for manufacturability","authors":"P. Hardin, G. Melvin, M. Nealon","doi":"10.1109/IEMT.1991.279813","DOIUrl":null,"url":null,"abstract":"The highest performing models of IBM's recently announced ES/9000 family of mainframe computers utilize a new high-performance thermal conduction module (TCM). To achieve improved system performance, a newly developed corderite glass ceramic material with an internal copper metallurgy and top surface thin film wiring was used. The new glass ceramic material provides a superior dielectric constant of 5.0, which yields a 27% improvement in propagation delay over IBM's existing 3090 alumina technology. The internal copper metallurgy yields a lower electrical resistance than the molybdenum metallurgy which was used with the alumina ceramic, notwithstanding a 40% reduction in conductor area. To meet the system wireability and chip count criteria, the area of the substrate was increased about 26%, the internal via and wiring pitch was decreased by 10%, and the total number of layers was increased by 66%.<<ETX>>","PeriodicalId":127257,"journal":{"name":"[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1991.279813","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The highest performing models of IBM's recently announced ES/9000 family of mainframe computers utilize a new high-performance thermal conduction module (TCM). To achieve improved system performance, a newly developed corderite glass ceramic material with an internal copper metallurgy and top surface thin film wiring was used. The new glass ceramic material provides a superior dielectric constant of 5.0, which yields a 27% improvement in propagation delay over IBM's existing 3090 alumina technology. The internal copper metallurgy yields a lower electrical resistance than the molybdenum metallurgy which was used with the alumina ceramic, notwithstanding a 40% reduction in conductor area. To meet the system wireability and chip count criteria, the area of the substrate was increased about 26%, the internal via and wiring pitch was decreased by 10%, and the total number of layers was increased by 66%.<>